The Advanced Atomic Force Microscopy Platform is constantly developing novel approaches and methods for nanoscale characterization. We have pioneered research in nanoscale surface electromechanical phenomena becoming a European reference in Piezoresponse Force Microscopy characterization, and we have developed novel methodologies such as Scanning Probe Piezoresistance to study strain induced electric phenomena, and different approaches to detect flexoelectric phenomena at the nanoscale.
The Advanced AFM platform has state of the art instruments with outstanding capabilities in operating temperature ranges, magnetic fields and environmental control. This, together with our expertise in all AFM modes provides the laboratory with the perfect competence to develop a wide range of studies in nanostructures and nanodevices, from chemical or magnetic to electric or mechanical phenomena, and its entanglement.
Scientific questions under study are ubiquitous, from crystalline oxide thin films to nanocomposites, nanoscale single crystals, polymeric fibers, 2D materials such as graphene, black phosphorous or CNT, biological samples such as viruses or functional operating nanodevices.